Box 89
Container
Contains 51 Results:
CIP-I—188,019
File — Box: 89, Folder: F223
CIP-I—319,523
File — Box: 89, Folder: F224
CIP II—S.N. 341-728
File — Box: 89, Folder: F225
Log
Item — Box: 89, Folder: F226
Allen / Buhks—Copper Electromigration
Item — Box: 89, Folder: F227
Allen—Electromigration of Copper Ions
Item — Box: 89, Folder: F228
Bragagnolo—Improved Theoretical Model
Item — Box: 89, Folder: F229
Bragagnolo—Reproducible Fabrication of High Efficiency CdS / Cu2S Cells
Item — Box: 89, Folder: F230
Bragagnolo—Stability of CdS Thin Cells
Item — Box: 89, Folder: F231
Brickman—Spectral Response Analysis Tool
Item — Box: 89, Folder: F232
Buhks—Quantum Mechanical
Item — Box: 89, Folder: F233
Hadley—CuxS / CdS FF Loss Measured by AC I (V)
Item — Box: 89, Folder: F234
Cook / Matysik—AES Study of Copper Injection
Item — Box: 89, Folder: F235
Florio—Copper Diffusion in CdS Layer
Item — Box: 89, Folder: F236
Hench—Process Control of Vacuum Deposited CdS
Item — Box: 89, Folder: F237
Matysik—Energy Gain Spectra in Low energy Electron Scattering
Item — Box: 89, Folder: F238
Matysik—Lateral Cu Electromigration
Item — Box: 89, Folder: F239
Matysik—Spectroscopy of CdS
Item — Box: 89, Folder: F240
Moldovan—AES Analysis of SnO2:Sb Thin Films
Item — Box: 89, Folder: F241
Pernisz—Development of a Standard Test Method for Measuring Photovoltaic Cell Performance
Item — Box: 89, Folder: F242
Pernisz—Device Characteristics of CuxS / CdS Solar Cells During Degradation and Heat Treatment
Item — Box: 89, Folder: F243
Pernisz—Junction Capacitance and Dispersion of Device Admittance of a Front-Wall Photovoltaic Thin-Film Cell
Item — Box: 89, Folder: F244
Roy—CdS Deposition on moving Substrates
Item — Box: 89, Folder: F245
Roy—Multi-layered CdS Growth Process
Item — Box: 89, Folder: F246
Roy / Luszcz—Structural and Substructural Characteristics of Vacuum Evaporated Oriented CdS Films (Part I & II)
Item — Box: 89, Folder: F247